Wafer inspection technology
This website was designed by Hsu Ting-Kai and Huang Tzu-Jui.
It contains various information related to chip testing technology.
Optical inspection technology can help manufacturers ensure quality and consistency throughout the manufacturing process, thereby reducing the risk of manufacturing defects and improving product yield!
The continuous innovation and advancement in chip manufacturing technology allow more electronic components to be accommodated on wafers, resulting in chips that are more powerful, smaller in size, and have lower power consumption.
The study sheet organizes various chip inspection technologies such as SEM, COM, AFM, etc., detailing their principles of operation, inspection targets, and the inspection processes.
Introduce the WLI (White Light Interferometry) inspection technology used in the Front-End Processing Stage of chip manufacturing to detect surface roughness of chips.
Class Notes Organization
We have organized the knowledge learned from the chip inspection technology course into a structured format.
Final Project Report
For the course final, we will choose a specific topic related to chip inspection technology to conduct an in-depth presentation.
