My Insight

This semester's project on white light interferometry (WLI) for roughness measurement, I realize how much I have learned about advanced semiconductor inspection techniques. Working with WLI has deepened my understanding of the principles of optical interferometry and its application in measuring surface topography with high precision. The project not only enhanced my mind of how technical skills in using sophisticated equipment and software but also emphasized the importance of meticulous sample preparation and data analysis. Collaborating with my team members, we faced and overcame several challenges, which improved our problem-solving abilities and teamwork. Overall, this project was an invaluable experience that has prepared me well for future endeavors in the field of semiconductor technology.

My Insight

Through this final project, I have gained a deeper understanding of the principles, objectives, and applications of White Light Interferometry (WLI). Additionally, during the process of creating the webpage, I acquired several skills related to web design and development, including how to effectively present data and information—skills that will undoubtedly be useful in the future. 

The course sheet covered various detection methods, and by researching and organizing this information, I expanded my knowledge and learned about different detection techniques and their applications. After completing the project and reflecting on the entire process, I realized that I have made significant progress in many areas. Not only did I deepen my understanding of the course content, but I also improved my practical skills and application abilities. This learning experience will be immensely beneficial for my future studies and work.